99905银河(中国)官方网站-Green App Store

DataExp

Data to insights dashboard & system assisted drill-down

DataExp-General DataExp-YMS DataExp-TMA

Overview

DataExp analytics platform combines "Intelligent Dashboard and Flexible Drill-down Analysis" to effectively help semiconductor companies leverage the value of data, improve yield and enhance product performance.

Data Management

Unified management of multidimensional & complex data

Efficient Process

The latest distributed database
and management system
Flexible & Scalable

Data Visualization

Interactive data
visualization

DataExp-General

General Semiconductor Data Analysis

Main Features

Handle multiple data format (.csv/.xls/.stdf/.ad5)
Support data manipulation (pivot, stack, merge, add new column, etc.)
Friendly GUI (drag & drop)
Dashboard & Interactive analysis
Statistical analysis (ANOVA, Chi-square, Correlation, Regression model, Kmean cluster)
Reusable template for plots & export to PowerPoint reports
Built-in Semiconductor related analysis (BinMap, Device Corner, etc.)

DataExp-YMS

Fab Inline and Yield Data Analysis

Main Features

Big data architecture ensures the data integrity & throughput
Customized intelligent dashboard provides fast yield signature diagnosis, root cause identification, performance drift detection
Advanced visual analytics enables fast drill-down & data mining

DataExp-TMA

Test Module (MPW, PCM, etc.) & RF data Analysis

Main Features

Integrate complex layout design attributes to large test data
Fast identification of process window/marginality through DOE analysis
Score card capability provides clear ranking of Fab process issues
Built-in statistic modules help identify key DOE impact
Specialized analysis including device gap, transistor mismatch (AVT), overlay
RF data management, de-embedding capability, RF parameter extraction
Auto-export all or selected analysis to PowerPoint